Hitachi High-Tech Corp has launched its AFM100 and AFM100 Plus systems – entry-level and intermediate-level models of Hitachi’s Atomic Force Microscopes (AFM). These tools are designed to offer ease of use and superior reliability for high-throughput R&D or quality control applications. AFM100 Plus The AFM is a type of the Scanning Probe Microscope (SPM) that ...

This story continues at Entry-level Atomic Force Microscopes

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